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A Mutual Information Based Automatic Registration and Analysis Algorithm for Defect Identification in Printed Documents

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3 Author(s)
Kartheek Chandu ; Department of Electrical Engineering, Rochester Institute of Technology, Rochester, NY 14623. ; Eli Saber ; Wencheng Wu

In this paper, we propose a defect analysis system, which automatically aligns a digitized copy of a printed output to a reference electronic original and subsequently illustrates potential image quality artifacts. We focus on image defects or artifacts caused by shortfalls in mechanical or electrophotographic processes. In this method, log-polar transform and mutual information techniques are used for image registration. A confidence map is then calculated by comparing the contrast and entropy of the neighborhood for each pixel in both images. This confidence map results in a qualitative difference between printed documents and electronic originals. The algorithm was demonstrated successfully on a database of 94 images with 95.7% accuracy.

Published in:

2007 IEEE International Conference on Image Processing  (Volume:3 )

Date of Conference:

Sept. 16 2007-Oct. 19 2007