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Robust paradigm for diagnosing hold-time faults in scan chains

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3 Author(s)
Tzeng, C.-W. ; Nat. Tsing-Hua Univ., Taipei ; Hsu, J.-J. ; Huang, S.-Y.

Hold-time violation is a common cause of failure at scan chains. A robust new paradigm for diagnosing such failures is presented. As compared to previous methods, the main advantage of this is the ability to tolerate non-ideal conditions, for example, under the presence of certain core logic faults or for those faults that manifest themselves intermittently. The diagnosis problem is first formulated as a 'delay insertion process'. Upon this formulation, two algorithms - a 'greedy' algorithm and a so-called 'best-alignment-based' algorithm - is proposed. Experimental results on a number of practical designs and ISCAS'89 benchmark circuits are presented to demonstrate its effectiveness.

Published in:

Computers & Digital Techniques, IET  (Volume:1 ,  Issue: 6 )