Cart (Loading....) | Create Account
Close category search window

Extending gate-level diagnosis tools to CMOS intra-gate faults

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Fan, X. ; Boston Consulting Group, Shanghai ; Moore, W.R. ; Hora, C. ; Gronthoud, G.

A comprehensive solution to the intra-gate diagnosis problem, including intra-gate bridging and stuck-open faults is provided. The work is based on a local transformation technique that allows transistor-level faults to be diagnosed by the commonly available gate-level fault diagnosis tools without having to deal with the complexity of a transistor-level description of the whole circuit. Three transformations are described: one for stuck-open faults, one for intra-gate resistive-open faults and one for intra-gate bridging faults. Experimental work has been conducted at NXP Semiconductors using the NXP diagnosis tool - FALOC. A number of real diagnosis results from the wafer testing data including both stuck-open faults and intra-gate bridging faults have confirmed the effectiveness of this new method.

Published in:

Computers & Digital Techniques, IET  (Volume:1 ,  Issue: 6 )

Date of Publication:

Nov. 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.