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In the framework of nondestructive evaluation and testing, microwave inverse scattering approaches demonstrated their effectiveness and the feasibility of detecting unknown anomalies in dielectric materials. In this letter, an innovative technique is proposed in order to enhance their reconstruction accuracy. The approach is aimed at first estimating the region-of-interest (RoI) where the defect is supposed to be located and then at improving the qualitative imaging of the crack through a level-set-based shaping procedure. In order to assess the effectiveness of the proposed approach, representative numerical results concerned with different scenarios and blurred data are presented and discussed.