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Browse Conference Publications > Optical MEMS and Nanophotonic ... Help

Improved Control of the Vertical Axis Scan for MEMS Projection Displays

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1 Author(s)
Milanovic, V. ; Adriatic Res. Inst., Berkeley

We demonstrate a MEMS projection display system with high speed, broadband, open-loop driving of the vertical axis which improves displayed image quality, increases the refresh rate capability and image brightness/efficiency. High speed capability in the vertical axis allows precise parallel line scanning as well as arbitrary line placement for features such as interlacing.

Published in:
Optical MEMS and Nanophotonics, 2007 IEEE/LEOS International Conference on

Date of Conference: Aug. 12 2007-July 16 2007

Page(s):
89 - 90
Print ISBN:
978-1-4244-0641-8
INSPEC Accession Number:
9678452
Conference Location :
Hualien
Digital Object Identifier :
10.1109/OMEMS.2007.4373854
Product Type:
Conference Publications

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