Cart (Loading....) | Create Account
Close category search window
 

Shape from Defocus via Diffusion

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Favaro, P. ; Heriot- Watt Univ., Edinburgh ; Soatto, S. ; Burger, M. ; Osher, S.J.

Defocus can be modeled as a diffusion process and represented mathematically using the heat equation, where image blur corresponds to the diffusion of heat. This analogy can be extended to nonplanar scenes by allowing a space-varying diffusion coefficient. The inverse problem of reconstructing 3D structure from blurred images corresponds to an "inverse diffusion" that is notoriously ill posed. We show how to bypass this problem by using the notion of relative blur. Given two images, within each neighborhood, the amount of diffusion necessary to transform the sharper image into the blurrier one depends on the depth of the scene. This can be used to devise a global algorithm to estimate the depth profile of the scene without recovering the deblurred image using only forward diffusion.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:30 ,  Issue: 3 )

Date of Publication:

March 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.