Cart (Loading....) | Create Account
Close category search window
 

H_{\infty } Channel Estimator Design for DS-CDMA Systems: A Polynomial Approach in Krein Space

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chengtao Cao ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore ; Lihua Xie ; Huanshui Zhang

This paper considers the problem of robust channel estimation for direct-sequence code-division multiple-access (DS-CDMA) systems with time-varying multipath fading channels. Due to the lack of accurate knowledge of model dynamics and statistics of system noises, a polynomial channel estimator is developed by virtue of the Krein space theory. The estimator is calculated by performing a J-spectral factorization. In this paper, under some conditions, we obtain a closed-form solution to this J-spectral factorization, which greatly reduces the computational load of the estimator design. The simulation results show that the proposed estimator provides a robust estimation performance against various types of noises and modeling errors.

Published in:

Vehicular Technology, IEEE Transactions on  (Volume:57 ,  Issue: 2 )

Date of Publication:

March 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.