Cart (Loading....) | Create Account
Close category search window
 

Experimental and Numerical Analysis of Stray Field From Transformers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Breschi, M. ; Univ. of Bologna, Bologna ; Cristofolini, A.

We present an assessment of a numerical methodology for evaluating stray fields from transformers by direct comparison with experimental results. The methodology can help to ensure compliance with the limits imposed by national and international laws and regulations on the levels of magnetic fields. We conducted validation experiments on a 1000-kVA cast-resin transformer. All measurements were performed in an anechoic room, in short-circuit conditions, along different directions in space. We compared two different numerical methods, based on linear and nonlinear 3-D finite-element methods, respectively, with the experimental results. Agreement with the measurements was very good. Numerical tools can be considered a valid alternative to measurements for the analysis of the stray magnetic induction field and for the design of shielded devices.

Published in:

Magnetics, IEEE Transactions on  (Volume:43 ,  Issue: 11 )

Date of Publication:

Nov. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.