Cart (Loading....) | Create Account
Close category search window

Energy efficient cluster id based routing in wireless sensor networks-analysis in nakagami-m fading channel model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ahmed, I. ; Wireless Signal Processing and Network Lab, Beijing University of Posts & Telecommunications, ; Munir, Saad A. ; Jian, Ma

This paper presents energy analysis of a new routing protocol CIDRSN (Cluster ID based Routing in static Sensor Networks) with closedform probability oferror and bit energy expression in Nakagami-m fading channel. CIDRSN takes the cluster ID as next hop address instead of cluster-head ID in routing table and eliminate the cluster formation phase and routing phase from being executed in each round, which reduces the energy consumption and increases the network life to about 16%. Robustness is increased by multi-path routing. Simulation results show that the proposed protocol outperforms the preceding hierarchical routing protocols.

Published in:

World of Wireless, Mobile and Multimedia Networks, 2007. WoWMoM 2007. IEEE International Symposium on a

Date of Conference:

18-21 June 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.