Cart (Loading....) | Create Account
Close category search window
 

Geometric Global Registration of Parallax Images Based on Wavelet Transform

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Guo Junbin ; Xi''an Res. Inst. of Hi-tec, Xi''an ; Guo Xiaosong ; Wang Wei ; Pu Pengcheng

Image registration is an important task of image processing. In parallax image mosaic, the geometric registration is a global registration minimized residual in translation model. In order to realize quick and robust geometric registration of parallax image, a coarse-to-fine global registration strategy using the coarse images weighted with detail image is proposed. Taking the advantage of multi-resolution characteristic of Wavelet, the original image is pyramid decomposed by Wavelet transformation. The registration result of the upper layer can be the initial value of the next layer in the global registration. The better initial value by this way is applied in the registration of coarse image and vertical detail image in the layer next to the bottom, and the correlative registration curve can be got. The extremums can be got from the correlative registration curve which weights the weight vector by means of the correlative registration curve of the vertical detail image in the layer next to the bottom. Then the optimal registration can be achieved. Experiments indicated that this method has high accuracy, reliability and real-time property.

Published in:

Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on

Date of Conference:

Aug. 16 2007-July 18 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.