Cart (Loading....) | Create Account
Close category search window
 

Experimental and Numerical Studies of Molecular Uptake Dynamics in HL-60 Cells Induced by Pulsed Electric Fields

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kennedy, S.M. ; Wisconsin Univ. Madison, Madison ; Zhen Ji ; Booske, J.H. ; Hagness, S.C.
more authors

Experimental and numerical studies have been conducted to investigate molecular uptake by HL-60 human promyelocytic leukemia cells induced by pulsed electric fields (PEFs). In experiments, we examined the internalization of a fluorescent marker, propidum iodide (PI), in HL-60 cells after exposure to 40 mus PEFs of variable amplitudes under fluorescence microscopy. General trends in PEF-induced intracellular molecular internalization as a function of time were observed and categorized. Two types of uptake response were identified: a gradual, low-level uptake that starts almost immediately after the PEF but persists for hundreds of seconds, and a rapid, high-level uptake that can be delayed by hundreds of seconds after the PEF. Presently, we are conducting quantitative measurements of PI uptake in order to establish the relationship between electric-field dosimetry and fluorophore uptake.

Published in:

Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on

Date of Conference:

17-22 June 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.