Close category search window
 

A Novel Parallel Genetic Algorithm for the Graph Coloring Problem in VLSI Channel Routing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jiaqi Yu ; Shanghai Univ., Shanghai ; Songnian Yu

With the increasing popularization of very large scale integrated (VLSI) chips, the improvement of their performance and the reduction of their cost have become two of the most important problems. In this paper, a novel Parallel Genetic Algorithm (PGA) is successfully applied to the graph coloring problem (GCP) in VLSI channel routing problem (CRP). Five topological structures of parallel models are discussed and compared in detail. Finally, one theorem has been proposed to evaluate the parallel performance based on a large amount of experiments. By using the theorem, we could easily modify the parameters to get the better results. The purpose of the research is to promote the performance of VLSI channel routing and the parallel computing. Also, some ideas for quantity analysis of parallel computing are put forward.

Published in:
Natural Computation, 2007. ICNC 2007. Third International Conference on  (Volume:4 )

Date of Conference: 24-27 Aug. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.