Cart (Loading....) | Create Account
Close category search window
 

Grid Creation Strategies for Efficient Ray Tracing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ize, T. ; Univ. of Utah, Salt Lake City ; Shirley, P. ; Parker, S.

Both theoretical analysis and practical experience have shown that when ray tracing a well-behaved model with N geometric primitives, the lowest ray tracing times using a grid acceleration structure occurs when the grid has 0(N) cells. This paper extends the theoretical analysis in two ways and then experimentally verifies that analysis for several geometric models. The first extension is to examine how model characteristics influence the choice of the number of cells in a grid, with models made of long thin primitives being of particular interest. For such models, the lowest trace times come when O(N1.5) cells are used, but may not always be practical due to the super-linear memory usage. The second extension is to nested grids where a grid cell may itself contain another grid. For the case of scattered data such as exploding particles, nesting is not helpful. For the case of tessellated manifolds with compact triangles, O(N0.6) cells at top level is optimal if only one level of nesting is allowed. For d levels of nesting, O(N3/(3+2d)) is optimal for the top level. For long thin primitives, O(N) cells at the top level is optimal when one level of nesting is allowed, but this again comes at the cost of super-linear memory usage.

Published in:

Interactive Ray Tracing, 2007. RT '07. IEEE Symposium on

Date of Conference:

10-12 Sept. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.