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Dynamic Single Event Upset Characterization of the MT48LC4M32B2TG-6 SDRAM Using Proton Irradiation

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2 Author(s)
Hiemstra, D.M. ; MDA Space Missions, Brampton ; Pranajaya, F.

Dynamic single event upset characterization of the MT48LC4M32B2TG-6 SDRAM using proton irradiation is presented. The device's upset rate in the space radiation environment is estimated.

Published in:

Radiation Effects Data Workshop, 2007 IEEE  (Volume:0 )

Date of Conference:

23-27 July 2007