Referenced Items are not available for this document.
The following paper describes the results of ionizing dose rate investigations into upset, supply photocurrent, latch-up, and burnout susceptibility of the Xilinx Virtex IV XC4VFX12. All investigations were performed on a commercial version of the device. The maximum no-upset dose rate was 2.8times108 rad(Si)/s. Photocurrent amplitudes as a function of dose rate were recorded.
Published in:
Radiation Effects Data Workshop, 2007 IEEE
(Volume:0
)
Date of Conference: 23-27 July 2007
- Page(s):
- 172 - 176
- Print ISBN:
- 978-1-4244-1464-2
- INSPEC Accession Number:
- 9810995
- Conference Location :
- Honolulu, HI
- Digital Object Identifier :
- 10.1109/REDW.2007.4342560
- Product Type:
- Conference Publications
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