Referenced Items are not available for this document.
Typically, single event upset (SEU) testing of analog to digital converters (ADC) has been done with static inputs. A test method, using a beat frequency and code error detection software, is presented. This test method allows for SEU characterization of ultra high speed ADC's, using dynamic inputs that more closely reflect the operating conditions in a space application. The test method is demonstrated on National Semiconductor's ADC08D1000WG-QV at 1 gigasample per second (GSPS) and an input frequency close to 1 GHz. A discussion of the SEU signatures and error rates are also presented.
Published in:
Radiation Effects Data Workshop, 2007 IEEE
(Volume:0
)
Date of Conference: 23-27 July 2007
- Page(s):
- 113 - 117
- Print ISBN:
- 978-1-4244-1464-2
- INSPEC Accession Number:
- 9810992
- Conference Location :
- Honolulu, HI
- Digital Object Identifier :
- 10.1109/REDW.2007.4342550
- Product Type:
- Conference Publications
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