Cart (Loading....) | Create Account
Close category search window
 

Simulation Tool for Factory Numerical Device Control System Network Based on EPA protocol

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Xiude Wu ; Yangtze Univ., Jingzhou ; Gangyan Li ; Liping Lu

Simulation is an indispensable technique to evaluate the performance of computer networks, because the continuous growth of network scale and diversity. In this paper, the modeling of EPA protocol in OPNET modeler, a simulation tool of control system network is developed. These configurable EPA protocol models allow to easily build factory numerical device control system (FNDCS) simulation with different network topologies for all kinds of discrete manufacturing factory, so that the dynamic performance issues could be studied during the planning stage and network performance problems could be caught ahead of the implementation stage. An example of using those models to a network of FDECS on OPNET Modeler as well as the network performance simulation results is also included in this paper.

Published in:

Automation and Logistics, 2007 IEEE International Conference on

Date of Conference:

18-21 Aug. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.