Scheduled System Maintenance on December 17th, 2014:
IEEE Xplore will be upgraded between 2:00 and 5:00 PM EST (18:00 - 21:00) UTC. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Tyszer, J. ; Poznari Univ. of Technol., Poznan ; Rajski, J. ; Mrugalski, G. ; Mukherjee, N.
more authors

This article describes a two-stage test response compactor with an overdrive section, scan chain selection logic, and an on-chip comparator and registration scheme for efficient signature-based diagnosis. This solution offers compaction ratios much higher than those determined by the ratio of scan chains to compactor outputs, and it guarantees very good observability and diagnostic resolution of scan errors, even for a large number of Xs. Experimental results confirm that the proposed solution does not compromise test quality and requires a minimal amount of information to control the compactor itself.

Published in:

Design & Test of Computers, IEEE  (Volume:24 ,  Issue: 5 )