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A Portable System for Upset and Transient Upset Testing of VLSI Circuits

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2 Author(s)
Milder, F.L. ; Spire Corporation Bedford, MA 01730 ; Shedd, W.

A portable system for testing VLSI circuits for both transient and permanent data upsets is described. The description includes both a general discussion of the system concept as well as the detailed design of a system capable of testing 64 data lines. A partially populated system using eight data lines has been built and used to verify system performance by testing a CMOS/SOS random access memory exposed to pulsed radiation from a linear accelerator. The test results on the memory are also discussed.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:29 ,  Issue: 6 )

Date of Publication:

Dec. 1982

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