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Geometrical Considerations in the Transient Ionization Testing of Digital Logic Circuits

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1 Author(s)
Allan H. Johnston ; Boeing Aerospace Company Seattle, Washington 98124

Mechanisms are identified that can cause the transient response of digital logic circuits to depend on the logic state in which they are irradiated. Several of these mechanisms depend on surface topology, and for these cases the sensitive logic states can be determined by examining the topology. General approaches for transient radiation testing are also discussed for several MSI and LSI device technologies.

Published in:

IEEE Transactions on Nuclear Science  (Volume:29 ,  Issue: 6 )