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A new method for high-resolution measurement of semiconductor laser linewidth in coherent optical systems

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2 Author(s)
Gysel, P. ; ETH-Inst. of Commun. Technol., Zurich, Switzerland ; Staubli, R.K.

A method for the observation of laser linewidth during operation in a coherent optical system is presented. The measurements agree well with the theoretical calculations and show that the power density spectrum of the backscattered intensity from a single-mode fiber corresponds to the laser spectrum with twice the source linewidth, shifted to baseband.<>

Published in:

Photonics Technology Letters, IEEE  (Volume:1 ,  Issue: 10 )