Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Electron Emission of Foils and Plated Wires Using a Flash X-Ray Spectrum

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chervenak, J.G. ; Mission Research Corporation 1150 Silverado Street P.O. Box 1209 La Jolla, California 92038 ; van Lint, V.A.J.

A photoemission diode was used to measure total backwards electron emission with unfiltered and filtered photon spectra from the SPI-600 X-ray generator. The samples consisted of thick Cu, Ni and Sn foils, Sn and Ni plated Cu wires used in cable fabrication, and Cu foils plated with Au and Rh. For the filtered spectrum the Cu emission is found to be 1.8 times larger than that calculated with Dellin-MacCallum values of photo-Compton currents. The Sn foil emission is 2.6 times that of the Ni, but the Sn plated wire emission is found to be only 1.7 times that of the Ni plated wire. When difference in electron average energy is taken into account, cables constructed from the Sn plated wire should show a SGEMP vacuum response that is only 25% larger than cables constructed from the Ni plated wire if all other parameters, e.g. gaps, are held constant.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:28 ,  Issue: 6 )