Cart (Loading....) | Create Account
Close category search window
 

Statistical Analysis of Step Stress Measurements in Hardness Assurance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Namenson, A.I. ; Naval Research Laboratory Washington DC 20375

The technique of maximum likelihood analysis can solve previously unresolved problems which arise in step stress measurements where the failure levels for each device can only be bounded between two often widely separated limits. The proposed analysis would be necessary in correctly computing means, standard deviations and safe survival limits.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:31 ,  Issue: 6 )

Date of Publication:

Dec. 1984

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.