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Total Dose Failure Levels of Some Vlsics

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2 Author(s)
King, E.E. ; Naval Research Laboratory Washington, D. C. 20375 ; Manzo, G.J.

Two types of devices representative of very-largescale-integration, 64k dynamic RAMs and 68000 microprocessors, have been studied in a total dose ionizing radiation environment. Both types of parts show an improved hardness compared to earlier test results for large-scale-integrated dynamic RAMs and microprocessors. This indicates that the previously developed downward trend of radiation hardness versus circuit complexity may not continue to prevail.

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Nuclear Science, IEEE Transactions on  (Volume:27 ,  Issue: 6 )