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Radiation Testing of Recent Vintage 8080A Microprocessors from Several Manufacturers

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1 Author(s)
Martin, Richard L. ; Electrical Engineering Department U. S. Naval Academy Annapolis, MD 21402

A novel radiation experiment was performed using recent vintage 8080A microprocessors from several manufacturers. Functional self tests were continuously monitored during irradiation. Total dose failure levels as well as implications of dose rate dependency and mode of failure are noted.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:27 ,  Issue: 4 )