Close category search window
 

An Investigation of Fast Low Power Charge Sensitive Preamplifier Design

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Glasmachers, A. ; Ruhr-Universität Bochum, Institut für Elektronik Postfach 102148, 4630 Bochum, Germany ; Cessna, J.R. ; Winkelnkemper, W.

As nuclear measurement instrumentation becomes more and more sophisticated, there is an increased interest in reducing the rise time in charge sensitive preamplifiers, e. g., to allow precision spectroscopy with narrow pulse shaping or to reduce jitter in timing measurements. For charge sensitive amplifiers with a FET input, the phase shift produced in the FET is found to approximate a delay which is seen to be the most significant limitation on the amplifier closed loop bandwidth. Loop stability constraints limit the achievable rise time to 1 to 2 times the overall loop delay which can approach that of the FET. Three design approaches and circuit examples are given using one, two, and three voltage gain stages preceding an output buffer.

Published in:
Nuclear Science, IEEE Transactions on  (Volume:27 ,  Issue: 1 )

Date of Publication: Feb. 1980

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.