Cart (Loading....) | Create Account
Close category search window
 

On the Problem of Reconstructing Images of Non-Scalar Parameters from Projections. Application to Vector Fields

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kramer, D.M. ; Laboratory for Ultrasonics, Dept. of Physics, Washington University, St. Louis, Mo. 63130 ; Lauterbur, Paul C.

It is demonstrated that in some cases it is possible to reconstruct images of fields whose local values are not scalars but are instead anisotropic. The approach taken relies upon Fourier analysis of the angular dependence and separation of scalar and non-scalar contributions by symmetry, and is applicable to anisotropies that do not have even symmetry. Although there are only a limited number of cases in which the problem can be analytically solved, there appears to be a variety of applications for which good approximations are available. The proposed algorithm, a hybrid of well known image reconstruction techniques, has been applied to calculated projections of test patterns, local regions of which having been assigned either scalar or vector behavior or both.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:26 ,  Issue: 2 )

Date of Publication:

April 1979

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.