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A Wide-Band Measuring System for Studying Charge-Coupled Device Characteristics

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2 Author(s)

A wide-band four-channel measuring system has been developed for studying charge-coupled devices and optimizing their characteristics. The system incorporates a high-to-low frequency processor capable of handling the 100-300 MHz high frequency clock CCD driver and generating the 0.5-10 MHz readout frequency, a microwave component based on a four-phase signal generator, a four-channel phase-matched RF power amplifier and a wide-band CCD test fixture. The phase error between the four low frequency channels is less than ± 5 degrees through the 1 to 10 MHz band, and less than ± 10 degrees in the 100 to 250 MHz range. The measuring system is capable of delivering an output voltage of 10 V peak-to-peak up to frequencies of 280 MHz and 170 MHz into a capacitative load of 25 pF and 100 pF, respectively.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:26 ,  Issue: 1 )

Date of Publication:

Feb. 1979

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