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Browse Journals & Magazines > Nuclear Science, IEEE Transac ...> Volume:25 Issue:6 Help

Dose Rate and Extended Total Dose Characterization of Radiation Hardened Metal Gate CMOS Integrated Circuits

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2 Author(s)
London, A. ; Wang, R.C.

First Page of the Article

Published in:
Nuclear Science, IEEE Transactions on  (Volume:25 ,  Issue: 6 )

Date of Publication: Dec. 1978

Page(s):
1172 - 1175
ISSN :
0018-9499
Digital Object Identifier :
10.1109/TNS.1978.4329509
Product Type:
Journals & Magazines
Date of Current Version :
12 November 2007
Issue Date :
Dec. 1978
Sponsored by :
IEEE Nuclear and Plasma Sciences Society

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