Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

VUV-Spectroscopy of Multiply Charged Ion Source-Plasmas

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Bruck, M. ; Institut fÿr Allgemeine Physik, Technische Universitat, Vienna/Austria ; Bruckmuller, R. ; Hertenberger, G. ; Winter, H.

The ion charge state distribution (CSD) in a multiply charged ion source- (MCIS-) plasma can be determined from the spectrum of resonance transitions of excited neutral and ionised plasma particles. The principle of this method, which for noble gas ions involves vacuum-ultraviolet spectroscopy, is described and first measurements for a DUOPLASMATRON-ion source operated with He and Ar are presented.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:23 ,  Issue: 2 )