Cart (Loading....) | Create Account
Close category search window

Satellite Anomalies from Galactic Cosmic Rays

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Binder, D. ; Hughes Aircraft Company Culver City, California 90230 ; Smith, E.C. ; Holman, A.B.

Anomalies in communication satellite operation have been caused by the unexpected triggering of digital circuits. Interactions with galactic cosmic rays were investigated as a mechanism for a number of these events. The mechanism assumed was the charging of the base-emitter capacitance of sensitive transistors to the turn-on voltage. The calculation of the cosmic ray event rate required the determination of transistor parameters, charge collection efficiencies, and the number of sensitive transistors. The sensitive transistors were determined by analyzing the results of a scanning electron microscope experiment. Calculations with iron cosmic rays resulted in an event rate of 3.1 × 10-3 per transistor per year, in reasonable agreement with the observed rate of 1.5 × 10-3.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:22 ,  Issue: 6 )

Date of Publication:

Dec. 1975

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.