Cart (Loading....) | Create Account
Close category search window

Sensitivity of SGEMP Response to Input Parameters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wenaas, E.P. ; IRT Corporation, San Diego, California 92138 ; Rogers, S. ; Woods, A.J.

Investigations into the sensitivity of SGEMP responses of simple geometries to various input parameters are made using the arbitrary body-of-revolution code ABORC. In particular, sensitivity of the response to emitted electron energy and angular distributions, emission levels, time dependence of the energy spectrum, time-phasing, and the choice of emission surfaces is investigated. Sensitivity to time-phasing, the choice of emission surfaces, and the time dependence of the energy spectrum is found to be relatively large, while sensitivity to energy and angular distributions and total yield variations arising from differences between the various emission predictive techniques and experiments is found to be relatively small. Electron emission codes now in existence appear to be adequate for predicting SGEMP responses, at least in the energy range above 1 keV.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:22 ,  Issue: 6 )

Date of Publication:

Dec. 1975

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.