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Effects of Ionizing Radiation on Monolithic PMOS Inverters

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1 Author(s)

The problem of radiation hardening of metal-oxidesemiconductor (MOS) systems is discussed from a circuit viewpoint. An inverter chain is studied, and its performance in radiation is related to device quality. Techniques for testing and hardening circuits are given.

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IEEE Transactions on Nuclear Science  (Volume:17 ,  Issue: 6 )