Cart (Loading....) | Create Account
Close category search window
 

Effects of 600 MeV Protons on M.O.S. Transistors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rouanet, J.C. ; Centre d''Etude Spatiale des Rayonnements Toulouse - France ; Giraud, J.L. ; de Lafond, Y.Gervais

This paper deals with a brief report of the irradiation of M.O.S.T. at C.E.R.N., using 600 MeV protons. The behavior of two fundamental parameters : the treshold voltage and the mobility of the holes in the channel were studied using p-channel transistors.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:16 ,  Issue: 5 )

Date of Publication:

Oct. 1969

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.