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Prediction of Integrated Flip-Flop Circuit Radiation Vulnerability

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2 Author(s)
Chang, W.W. ; Northrop Corporate Laboratories Hawthorne, California ; Raymond, J.P.

The ionizing radiation and neutron displacement damage failures of integrated flip-flop circuits are predicted from the electrical circuit parameters, geometry, and dominant radiation-induced failure mechanisms. The results are sufficiently accurate to guide an experimental study or a first-order vulnerability analysis. Techniques and approximations used are much simplier than the computer-aided circuit analysis usually required for the detailed determination of circuit response. Experimental and predicted radiation failure thresholds are presented for both a dielectrically-isolated and a junction-isolated circuit.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:14 ,  Issue: 6 )

Date of Publication:

Dec. 1967

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