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The ionizing radiation and neutron displacement damage failures of integrated flip-flop circuits are predicted from the electrical circuit parameters, geometry, and dominant radiation-induced failure mechanisms. The results are sufficiently accurate to guide an experimental study or a first-order vulnerability analysis. Techniques and approximations used are much simplier than the computer-aided circuit analysis usually required for the detailed determination of circuit response. Experimental and predicted radiation failure thresholds are presented for both a dielectrically-isolated and a junction-isolated circuit.