By Topic

Prediction of Integrated Flip-Flop Circuit Radiation Vulnerability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
W. W. Chang ; Northrop Corporate Laboratories Hawthorne, California ; J. P. Raymond

The ionizing radiation and neutron displacement damage failures of integrated flip-flop circuits are predicted from the electrical circuit parameters, geometry, and dominant radiation-induced failure mechanisms. The results are sufficiently accurate to guide an experimental study or a first-order vulnerability analysis. Techniques and approximations used are much simplier than the computer-aided circuit analysis usually required for the detailed determination of circuit response. Experimental and predicted radiation failure thresholds are presented for both a dielectrically-isolated and a junction-isolated circuit.

Published in:

IEEE Transactions on Nuclear Science  (Volume:14 ,  Issue: 6 )