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Heavy Particle Radiation Damage Effects in Lithium Drifted Silicon Detectors

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2 Author(s)
Harry M. Mann ; Electronics Division ; Jan L. Yntema

Deterioration of charged-particle resolution-width, for p-i-n detectors prepared by lithiumion-drift techniques, was observed during bombardment with protons, and alpha particles. During exposure the resolution-width increased without loss of rectification when damage was confined to the intrinsic region. Significant deterioration in response was observed for 108 particles/cm2. Rapid loss of rectification was observed during exposure to neutrons at energies mostly in the range of from 1 to 10 MeV and for a flux of 109 neutrons/cm2/sec. The damage effects were studied with several detectors having an electron resolution-width of 15 to 20 keV at room temperature, and a window thickness of approximately 1 mg/cm2. Limitations on recovery, by further drift treatment, were observed for an integrated charged-particle flux in excess of 1012 particles/cm2. The response of these detectors to electrons before and after damage, and to heavy charged particles during production of damage and after recovery, is described.

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IEEE Transactions on Nuclear Science  (Volume:11 ,  Issue: 3 )