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A Controlled-Temperature Device for Transistor Tests

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2 Author(s)
King, E.F. ; Elec. Engrg. Dept., University of California, Los Angeles, Calif. ; Walker, F.L.

A laboratory device for operating transistors at selected, known temperatures in the 15-95-degrees C range is described. After a simple, one-time calibration no further temperature measurements are necessary. The unit is simple, rugged and easily constructed.

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Education, IRE Transactions on  (Volume:4 ,  Issue: 1 )