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Effects of Population Domain Parameters on Statistical Life Tests

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2 Author(s)
A. O. Greer ; Armament Control Engineering Autonetics, a Division of North American Aviation, Inc. ; A. A. Patterson

A statistical life test plan measuring compliance to a reliability standard often assumes a constant failure rate model on the premises that only time domain parameters are important and that both producer and consumer enter relatively constant risk plans. The authors contend that population domain parameters can introduce significant variations in both producer and consumer risks. In particular, they solve the variations of these risks as a function of sample size for the popular AGREE life test plan.

Published in:

IEEE Transactions on Aerospace  (Volume:1 ,  Issue: 2 )