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Degradation Analysis of 2-μm DFB Laser Using Optical Beam-Induced Current Technique

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6 Author(s)

The degradation behavior of 2-mum wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant-power aging is investigated. The degradation mechanism is governed by diffused defects with a parallel direction in the crystal plane. Furthermore, it is clarified that the epitaxial layers on the mesa affect both first- and second-stage degradations.

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Electron Devices, IEEE Transactions on  (Volume:54 ,  Issue: 10 )