Referenced Items are not available for this document.
The degradation behavior of 2-mum wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant-power aging is investigated. The degradation mechanism is governed by diffused defects with a parallel direction in the crystal plane. Furthermore, it is clarified that the epitaxial layers on the mesa affect both first- and second-stage degradations.
Published in:
Electron Devices, IEEE Transactions on
(Volume:54
,
Issue:
10
)
Date of Publication: Oct. 2007
- Page(s):
- 2644 - 2649
- ISSN :
- 0018-9383
- INSPEC Accession Number:
- 9645753
- Digital Object Identifier :
- 10.1109/TED.2007.904961
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 24 September 2007
- Issue Date :
- Oct. 2007
- Sponsored by :
- IEEE Electron Devices Society
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