Cart (Loading....) | Create Account
Close category search window

A Diagnostic Method for Time Resolved Spatial Profile Measurements of Proton and Impurity Density and Temperature

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Burrell, Keith H. ; General Atomic Company San Diego, California ; Lietzke, Alan F. ; Schaffer, Michael J.

A new diagnostic technique, based on elastic scattering of neutral atoms off the plasma ions, is proposed and analyzed. Space and time resolved measurements of the number densities and temperatures of the various components of the plasma are possible by energy analysis of the scattered neutral atoms. The ability to resolve ions of different masses is limited by ion thermal motion and the energy and angular dependence of the scattering cross sections. In hydrogenic plasmas with impurities, the scattering by the impurities is easily resolvable from the scattering of protons, even when the individual impurity contributions cannot be separately resolved. Detected particle count rates are calculated for a conceputal system for a tokamak plasma (n ~ 1013 cm-3, Ti ~ 300 eV). Time resolution of ~ 10 ms with spatial resolution of a few cm are predicted.

Published in:

Plasma Science, IEEE Transactions on  (Volume:6 ,  Issue: 2 )

Date of Publication:

June 1978

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.