Cart (Loading....) | Create Account
Close category search window
 

Feasibility of a High Average Power Crossed Field Closing Switch

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Lutz, Michael A. ; Hughes Research Laboratories 3011 Malibu Canyon Road Malibu, CA 90265 ; Harvey, Robin J. ; Alting-Mees, Hemmo

Results of an experimentalprogram to determine the feasibility of using a crossed field device as a high average power triggered closing switch are reported. The tube contained coaxial, cylindrical electrodes and was triggered by pulsing a magnetic field (<0.1 T) to a value sufficiently high to trap electrons and initiate conduction. Holdoff voltages up to 60 kV were achieved, with peak (circuit limited) currents as high as 20 kA and pulse durations in the range of 1 to 100 ¿s. Ignition jitter was ~0.1 ¿s, and the voltage recovery rate was 2 kV/¿s after 20 kA conduction and a 50 ¿s deionization time. These single and double shot data indicate that it should be possible to build such a device to operate at high average power levels for use in high power (MW) modulators.

Published in:

Plasma Science, IEEE Transactions on  (Volume:4 ,  Issue: 2 )

Date of Publication:

June 1976

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.