By Topic

An Orientable Secondary Emission Detector for Plasma Experiments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Deck, C. ; Institute of Plasma Physics, Nagoya University, Nagoya, Japan ; Iguchi, H. ; Jacquinot, J. ; Kawabe, T.

An orientable secondary emission detector is described. Its response to the fast neutral atom flux emitted by a plasma allows to measure the density profile, the phase space distribtuion function and the average energy of the plasma ions.

Published in:

Plasma Science, IEEE Transactions on  (Volume:3 ,  Issue: 2 )