Cart (Loading....) | Create Account
Close category search window

Some Aspects of Electron Beam Optics and X-Ray Production with the Linear Accelerator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Haimson, J. ; Accelerator Research Radiation Division Varian Associates Palo Alto, California

Part I A mathematical presentation of linear accelerator fundamental design parameters leads to optimization formulae for X-ray output and operational stability. A narrow spread of electron energies is desirable in most linear accelerator applications and especially when post-acceleration beam bending is utilized to project a stable high energy X-ray beam at right angles to the accelerator waveguide. Part II Some consideration is given to electron source optics and an analysis of a chopped prebunched injection system is presented together with a comparison of different types of buncher design with emphasis on obtaining narrow energy spectrum small cross-section electron beams. A method of analysing prebunched injection current and buncher acceptance characteristics is described

Published in:

Nuclear Science, IRE Transactions on  (Volume:9 ,  Issue: 2 )

Date of Publication:

April 1962

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.