By Topic

Dielectric Thickness Measurement Employing Heterodyne Technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

A microwave system for measuring the thickness of dielectric materials employing the heterodyne technique is described. Calibration curves relating the dc output voltage and dielectric thickness are presented for leather, glass, and cartons. The system was operated at 9 GHz. The experimental results illustrate the suitability of the technique for industrial applications.

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:IM-34 ,  Issue: 1 )