By Topic

Microprocessor-Based Solar Cell Measurement System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

A microprocessor-based solar cell standard characteristics measurement system is described. Data aquisition and digital conversion of the current-to-voltage characteristics and the spectral response allows the performance of several operations as averaging, storage, minicomputer connection, and parameter determination of the theoretical models introduced. Several results are shown concerning the accuracy of the method on the determination of series resistance, reverse saturation current, and the minority carriers lifetime on the base region of solar cells.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:27 ,  Issue: 2 )