IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Instrumentation and Measureme ...> Volume:22 Issue:2 Help

Recursive Estimation of the Mean Value of a Random Variable Using Quantized Data

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Majithia, J.C.

Previously published methods and results for fast recursive estimation of the mean value of a continuous random variable are extended to the case of a random signal quantized by an equi-interval A/D converter.

Published in:
Instrumentation and Measurement, IEEE Transactions on  (Volume:22 ,  Issue: 2 )

Date of Publication: June 1973

Page(s):
176 - 177
ISSN :
0018-9456
Digital Object Identifier :
10.1109/TIM.1973.4314132
Product Type:
Journals & Magazines
Date of Current Version :
12 November 2007
Issue Date :
June 1973
Sponsored by :
IEEE Instrumentation and Measurement Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.