By Topic

Economic Efficiency Analysis of Wafer Fabrication

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Leachman, R.C. ; Univ. of California at Berkeley, Berkeley ; Shengwei Ding ; Chen-Fu Chien

Economic efficiency analysis of semiconductor fabrication facilities (fabs) involves tradeoffs among cost, yield, and cycle time. Due to the disparate units involved, direct evaluation and comparison is difficult. This article employs data envelopment analysis (DEA) to determine relative efficiencies among fabs over time on the basis of empirical data, whereby cycle time performance is transformed into monetary value according to an estimated price decline rate. Two alternative DEA models are formulated to evaluate the influence of cycle time and other performance attributes. The results show that cycle time and yield follow increasing returns to scale, just as do cost and resource utilization. Statistical analyses are performed to investigate the DEA results, leading to specific improvement directions and opportunities for relatively inefficient fabs. Note to Practitioners-Speed of manufacturing is an important metric of factory performance, yet it has long been a challenge to integrate its value into overall performance evaluation. However, for many semiconductor products, a predictable rate of decline in selling prices makes it possible to transform time value into monetary value. This study employs a novel method to incorporate a speed metric into economic efficiency evaluation and thereby provide a guideline for improving fab efficiency in manufacturing practice. Furthermore, this study integrates factory productivity and cycle time into a relative efficiency analysis model that jointly evaluates the impact of these two factors in manufacturing performance. In particular, we validate this approach with data from ten leading wafer fabs obtained by the Competitive Semiconductor Manufacturing Program and we discuss managerial implications.

Published in:

Automation Science and Engineering, IEEE Transactions on  (Volume:4 ,  Issue: 4 )