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A pattern recognition system is designed to solve the model characterization problem of distributed systems. The characterization problem in the pattern recognition domain is the mapping of the observation and input data of the distributed system into one of the designated classes. Mathematical structures which are likely to represent the system are designated as classes from the a priori information of the system under consideration. A feature extractor and a classifier are designed which are tailored for this problem. The pattern recognition system is assessed by using the leaving-one-out method on simulated data.