By Topic

A Pattern Recognition Approach to Model Characterization of Distributed Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

A pattern recognition system is designed to solve the model characterization problem of distributed systems. The characterization problem in the pattern recognition domain is the mapping of the observation and input data of the distributed system into one of the designated classes. Mathematical structures which are likely to represent the system are designated as classes from the a priori information of the system under consideration. A feature extractor and a classifier are designed which are tailored for this problem. The pattern recognition system is assessed by using the leaving-one-out method on simulated data.

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:17 ,  Issue: 3 )