Cart (Loading....) | Create Account
Close category search window
 

Direct Fourier Reconstruction in Fan-Beam Tomography

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

We consider the problem of reconstructing tomographic imagery from fan-beam projections using the direct Fourier method (DFM). Previous DFM reconstructions from parallel-beam projections produced images of quality comparable to that of filtered convolution back-projection. Moreover, the number of operations using DFM in the parallel-beam case is proportional to N2 log N versus N3 for back projection [3]. The fan-beam case is more complicated because additional interpolation of the nonuniformly spaced rebinned data is required. We derive bounds on the detector spacing in fan-beam CT that enable direct Fourier reconstruction and describe the full algorithm necessary for processing the fan-beam data. The feasibility of the method is demonstrated with an example. A key result of this paper is that high-quality imagery can be reconstructed from fan-beam data using the DFM in 0 (N2 log N) operations.

Published in:

Medical Imaging, IEEE Transactions on  (Volume:6 ,  Issue: 3 )

Date of Publication:

Sept. 1987

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.