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Electromagnetic Field Distribution Measurements Using an Optically Scanning Probe System

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8 Author(s)
Takahashi, M. ; Nat. Inst. of Inf. & Commun. Technol., Sendai ; Kawasaki, K. ; Ohba, H. ; Ota, H.
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An optically scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for high speed, low-invasive measurement of electromagnetic field distribution. We present some examples of measurement of electric field distributions using a LiNbO3 crystal substrate and the probe system. We have also measured magnetic field distributions above an MSL using a magnetic garnet thin film in the gigahertz range.

Published in:

Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on

Date of Conference:

9-13 July 2007